国際交流・公開研究セミナーのご案内

日程: 2013年9月13日（金）　16:00 - 17:00
場所: 後楽園キャンパス 6号館7階 6701 号室

日程: 2013年9月13日（金）　16:00 - 17:00

場所: 後楽園キャンパス 6号館7階 6701 号室

講演者: Prof. Detlef Gunther （スイス連邦，スイス連邦工科大学ETH）

内容: 題目： Analysis of nano particles and laser-generated aerosol using ICPMS

アブストラクト：
Utilization of metallic engineered nanoparticles (ENP) is progressing rapidly; therefore,
characterization of metallic ENP is of increasing importance to better understand and tailor their performance for more specific, cost effective, and safer application. For such understanding a detailed characterization of its most important roperties is inevitable and currently uses a set of different echniques such as scanning electron microscopy (SEM), transmission electron microscopy (TEM), fractionation (FFF) coupled to various detectors, or single particle inductively coupled plasma mass pectrometry (sp-ICPMS). Unfortunately, using these complementary techniques is very ime-consuming and in most cases such an in-depth analysis is not necessary to improve or evaluate all properties. In fact this calls for reliable and fast analytical techniques able to determine only the most important parameters such as elemental composition, size/mass and the particle number concentration.
Therefore, a sample introduction system based on monodisperse microdroplet generation which allows the transportation of single droplets into ICPMS was proposed. This approach is promising due to high sensitivity, low consumption of sample material, 100% sample transport efficiency, temporally separated signals of single events corresponding to one droplet/particle and possibility of calibrating the nanoparticle mass by using analyte solution.
In this work the advantages and limitations of the microdroplet introduction system, when compared to commonly applied, state-of-the art nanoparticle characterization techniques (SEM, TEM, FFF and sp-ICP-MS), were studied using various ENP suspensions of different types, sizes and polydispersities.
Furthermore, laser generated particle were tracked through an ICP to determine the vaporization points within the ICP, which has significant influence on the quantification capabilities, specifically when non-matrix matched standards are used for calibration. Some experimental observations and modeling data will be discussed in the presentation.

参加費: 無料

参加手続き: 事前申し込み不要

連絡先：中央大学理工学部応用化学科古田直紀